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Live Q&A - Self-testing in Embedded Systems

Colin Walls - Watch Now - Duration: 19:50

Live Q&A with Colin Walls for the talk titled Self-testing in Embedded Systems
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No comments or questions yet. Will you be the one who will break the ice?

09:42:52	 From  Rocco Brandi : Can you give an example of trap handler?
09:43:01	 From  Erwin : Really nice overview! You mentioned static analysis tools for stack usage prediction. Have you some examples?
09:43:38	 From  Cezar Burlacu : Hi, do you recommend any tool for static stack analysis?
09:44:58	 From  Michael Kirkhart : +1 for Morse code for error messages
09:45:14	 From  Jeremy Erdmann : You talk about overriding [] operator for array bound violations.  What are your thoughts on things like C++'s std::array which requires a defined size?  Or perhaps a plug for the Embedded Template Library's etl::array.  Similarly, the ETL has the concept of a span for when passing arrays around your application.
09:45:31	 From  jvillasante : I liked the idea of checks on boot up (like the RAM check). Can you expand on that? What other checks would you think would be useful on boot up to have more confidence on a clean and well behaved system before launching applications?
09:46:38	 From  Steve Wheeler : Back in the late 1970s, my local computer club had a blind member who used an Apple II that had a redirect on character output to produce Morse code on the speaker.
09:48:07	 From  Dan Rittersdorf : Can you talk about background testing of RAM in a homogenous or heterogeneous multicore system where interrupt level won't be enough to guarantee another core won't read while the built-in test is writing RAM?    Is there a way to do that safely?
09:48:23	 From  Scott K. : MCAS anybody?
09:51:22	 From  David Kanceruk : Speaking of car stories, here's one you might enjoy: https://www.eetimes.com/ok-your-dad-primes-his-fuel-injected-engine-with-gas-and-you-fixed-it-with-a-ttl-logic-probe-what-kind-of-family-is-this-anyway/#
09:53:26	 From  busa2191 : I have had the devils job with the reset with peripherals not working till 2.5 volts. And NXP embedded uC's working to from 1.8 volts beside a voltage supervisor any issues on voltage bumping on the way.
09:57:16	 From  EricS : Texas Instruments can compute worst case stack usage with its compiler toolchain.  (Caveats: You need to manually inform it about function pointer usage. They have a way to annotate assembler routines so that their tool picks up the stack usage of assembler code.  You need to know the entry function for each one of your threads.)
09:57:26	 From  Pradeepa : Do you think self testing, given the engineering cost, needs to be implemented in devices that work in non critical applications, ex: consumer electronics?
09:58:27	 From  JackW : Could you elaborate on loop back testing of peripherals? Is this as simple as a verify of peripheral registers
09:58:32	 From  patelk5 : Can static code analysis be sufficient for a lot of the software errors you mentioned (such as array bounds checking)?
09:59:44	 From  Keith J : Thank you Colin!
09:59:55	 From  patelk5 : Thanks Colin!
10:00:11	 From  Pradeepa : Thanks Collin!
10:00:11	 From  Tom.Davies : Thank you
10:00:13	 From  Dan Rittersdorf : Great talk.   Thank you!
10:00:14	 From  Jorge Conti : Thanks Colin!
10:00:22	 From  Agnes B : Thank you
10:00:24	 From  Gary : Thanks again Colin!
10:00:30	 From  Erwin : Thank You!
10:00:30	 From  JackW : Thank you
10:00:34	 From  Lee Thalblum : Thanks Colin!
10:00:50	 From  Scott H : Thanks Colin