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Self-testing in Embedded Systems

Colin Walls - Available in 11 days, 7 hours and 26 minutes (2021-05-19 08:00 EDT)

All electronic systems carry the possibility of failure. An embedded system has intrinsic intelligence that facilitates the possibility of predicting failure and mitigating its effects. This talk will review the options for self-testing that are open to the embedded software developer. Testing algorithms for memory will be outlined and some ideas for self-monitoring software in multi-tasking and multi-CPU systems will be discussed.
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